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J. R. Miles

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1980 – 1989

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1989
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Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler:
Cost Analysis of Test Method Environments. ITC 1989: 875-883
1988
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J. R. Miles, Anthony P. Ambler, K. A. E. Totton:
Estimation of area and performance overheads for testable VLSI circuits. ICCD 1988: 402-407

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