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Y. Naoki

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2007
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Z. Li, Tom Schram, Luigi Pantisano, A. Stesmans, Thierry Conard, S. Shamuilia, V. V. Afanasiev, A. Akheyar, Sven Van Elshocht, D. P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, Stefan De Gendt, Kristin De Meyer:
Mechanism of O₂-anneal induced V_fb shifts of Ru gated stacks. Microelectron. Reliab. 47(4-5): 518-520 (2007)

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