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ORCIDJohannes A. M. van der Weide
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2010 – 2019
- 2016
[j9]Samira S. Farahani, Ton J. J. van den Boom, Hans van der Weide, Bart De Schutter
:
An approximation method for computing the expected value of max-affine expressions. Eur. J. Control 27: 17-27 (2016)- 2015
- [j8]Johannes A. M. van der Weide, Mahesh D. Pandey:
A stochastic alternating renewal process model for unavailability analysis of standby safety equipment. Reliab. Eng. Syst. Saf. 139: 97-104 (2015) - 2013
- [c3]Yanbin Shen, Johannes A. M. van der Weide, Jasper H. M. Anderluh:
A Benchmark Approach of Counterparty Credit Exposure of Bermudan Option under Lévy Process: The Monte Carlo-COS Method. ICCS 2013: 1163-1171 - 2012
- [j7]Tianjin Cheng, Mahesh D. Pandey, Johannes A. M. van der Weide:
The probability distribution of maintenance cost of a system affected by the gamma process of degradation: Finite time solution. Reliab. Eng. Syst. Saf. 108: 65-76 (2012) - 2011
- [j6]Johannes A. M. van der Weide, Mahesh D. Pandey:
Stochastic analysis of shock process and modeling of condition-based maintenance. Reliab. Eng. Syst. Saf. 96(6): 619-626 (2011) - 2010
- [j5]Johannes A. M. van der Weide, Mahesh D. Pandey, Jan M. van Noortwijk:
Discounted cost model for condition-based maintenance optimization. Reliab. Eng. Syst. Saf. 95(3): 236-246 (2010) - [c2]Samira S. Farahani, Ton J. J. van den Boom, Hans van der Weide, Bart De Schutter:
An approximation approach for model predictive control of stochastic max-plus linear systems. WODES 2010: 376-381
2000 – 2009
- 2009
- [j4]Jasper H. M. Anderluh, Johannes A. M. van der Weide:
Double-sided Parisian option pricing. Finance Stochastics 13(2): 205-238 (2009) - [j3]Sebastian P. Kuniewski, Johannes A. M. van der Weide, Jan M. van Noortwijk:
Sampling inspection for the evaluation of time-dependent reliability of deteriorating systems under imperfect defect detection. Reliab. Eng. Syst. Saf. 94(9): 1480-1490 (2009) - 2008
- [j2]Jan M. van Noortwijk, Johannes A. M. van der Weide:
Applications to continuous-time processes of computational techniques for discrete-time renewal processes. Reliab. Eng. Syst. Saf. 93(12): 1853-1860 (2008) - 2007
- [j1]Jan M. van Noortwijk, Johannes A. M. van der Weide, Maarten-Jan Kallen, Mahesh D. Pandey:
Gamma processes and peaks-over-threshold distributions for time-dependent reliability. Reliab. Eng. Syst. Saf. 92(12): 1651-1658 (2007) - 2004
- [c1]Jasper Anderluh, Hans van der Weide:
Parisian Options - The Implied Barrier Concept. International Conference on Computational Science 2004: 851-858
Coauthor Index
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