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ORCIDShiho Hagiwara
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Journal Articles
- 2014
[j5]Koh Yamanaga, Shiho Hagiwara, Ryo Takahashi, Kazuya Masu
, Takashi Sato:
State-Dependence of On-Chip Power Distribution Network Capacitance. IEICE Trans. Electron. 97-C(1): 77-84 (2014)- [j4]Shiho Hagiwara, Takanori Date, Kazuya Masu, Takashi Sato:
Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis. IEICE Trans. Electron. 97-C(4): 280-288 (2014) - 2010
- [j3]Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato:
Linear Time Calculation of On-Chip Power Distribution Network Capacitance Considering State-Dependence. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(12): 2409-2416 (2010) - 2009
- [j2]Shiho Hagiwara, Takashi Sato, Kazuya Masu:
Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(4): 1031-1038 (2009) - 2008
- [j1]Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu:
Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 91-A(4): 951-956 (2008)
Conference and Workshop Papers
- 2023
- [c7]Dennis Rich, Anna Kasperovich, Mohamadali Malakoutian, Robert M. Radway, Shiho Hagiwara, Takahide Yoshikawa, Srabanti Chowdhury, Subhasish Mitra:
Thermal Scaffolding for Ultra-Dense 3D Integrated Circuits. DAC 2023: 1-6 - 2010
- [c6]Kentaro Katayama, Shiho Hagiwara, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato:
Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis. ICCAD 2010: 703-708 - [c5]Takanori Date, Shiho Hagiwara, Kazuya Masu, Takashi Sato:
Robust importance sampling for efficient SRAM yield analysis. ISQED 2010: 15-21 - [c4]Shiho Hagiwara, Koh Yamanaga, Ryo Takahashi, Kazuya Masu, Takashi Sato:
Linear time calculation of state-dependent power distribution network capacitance. ISQED 2010: 75-80 - 2007
- [c3]Shiho Hagiwara, Takumi Uezono, Takashi Sato, Kazuya Masu:
Improvement of power distribution network using correlation-based regression analysis. ACM Great Lakes Symposium on VLSI 2007: 513-516 - [c2]Takashi Sato, Takumi Uezono, Shiho Hagiwara, Kenichi Okada, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu:
A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation. ISQED 2007: 21-26 - [c1]Takashi Sato, Shiho Hagiwara, Takumi Uezono, Kazuya Masu:
Weakness Identification for Effective Repair of Power Distribution Network. PATMOS 2007: 222-231
Coauthor Index
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