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ORCIDRui Gao 0003
Person information
- unicode name: 高汭
- affiliation: China Electronic Product Reliability and Environmental Testing Research Institute (CEPREI)
Other persons with the same name
- Rui Gao — disambiguation page
- Rui Gao 0001 — University of Texas at Austin, McCombs School of Business, Austin, TX, USA
- Rui Gao 0002
![[0000-0001-6636-4913]](https://dblp.dagstuhl.de/img/orcid-mark.12x12.png "0000-0001-6636-4913")
— Northeast Agricultural University, Institutions of Electrical and Information, Harbin, China - Rui Gao 0004 — Wuhan University, School of Computer Science, Wuhan, China
- Rui Gao 0005 — Xidian University, Key Laboratory of Integrated Service Networks, Xi'an, China
- Rui Gao 0006 — Shandong University, School of Control Science and Engineering, Jinan, China
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2020 – today
- 2023
[j3]James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jianfu Zhang:
A Pragmatic Model to Predict Future Device Aging. IEEE Access 11: 127725-127736 (2023)- 2021
- [j2]Chao Peng, Rui Gao, Zhifeng Lei, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang:
Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs. IEEE Access 9: 22587-22594 (2021) - 2020
- [j1]Chao Peng, Zhifeng Lei, Rui Gao, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang:
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET. IEEE Access 8: 99037-99046 (2020) - [c3]Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang:
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS 2020: 1-5 - [c2]Linglin Jing, Rui Gao, Zhigang Ji, Runsheng Wang:
"Shift and Match" (S...M) method for channel mobility correction in degraded MOSFETs. IRPS 2020: 1-8
2010 – 2019
- 2019
- [c1]Jianfu Zhang, Azrif Manut, Rui Gao, Mehzabeen Mehedi, Zhigang Ji, Weidong Zhang, John S. Marsland:
An assessment of RTN-induced threshold voltage jitter. ASICON 2019: 1-4
Coauthor Index
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