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Luis Elvira Villagra

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Journal Articles

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2007
[j1]
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  - journals/dt/WangWLMKGVWE07
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  - https://dblp.org/rec/journals/dt/WangWLMKGVWE07
Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger:
Modeling Power Supply Noise in Delay Testing. IEEE Des. Test Comput. 24(3): 226-234 (2007)

Conference and Workshop Papers

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2009
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  - conf/ets/RiusVM09
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Josep Rius, Luis Elvira Villagra, Maurice Meijer:
A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. ETS 2009: 135-140
2006
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Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger:
Power Supply Noise in Delay Testing. ITC 2006: 1-10

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