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2010 – 2019
- 2010
[c6]James Crafts, David Bogdan, Dennis Conti, Donato O. Forlenza, Orazio P. Forlenza, William V. Huott, Mary P. Kusko, Edward Seymour, Timothy Taylor, Brian Walsh:
Testing the IBM Power 7™ 4 GHz eight core microprocessor. ITC 2010: 49-58
2000 – 2009
- 2009
- [j4]Gerard Salem, D. W. Wittig, Thomas G. Foote, Bryan J. Robbins, C. Hirko, Donato O. Forlenza, Franco Motika, J. A. Kyle, Mary P. Kusko, Orazio P. Forlenza, R. J. Frishmuth, Rona Yaari, S. Michnowski, U. Baur:
Structural and functional test of IBM System z10 chips. IBM J. Res. Dev. 53(1): 5 (2009) - [c5]Haoxing Ren, Mary P. Kusko, Victor N. Kravets, Rona Yaari:
Low cost test point insertion without using extra registers for high performance design. ITC 2009: 1-8 - 2001
- [c4]Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott:
99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor. ITC 2001: 586-592
1990 – 1999
- 1999
- [j3]Peilin Song, Franco Motika, Daniel R. Knebel, Richard F. Rizzolo, Mary P. Kusko:
S/390 G5 CMOS microprocessor diagnostics. IBM J. Res. Dev. 43(5): 899-914 (1999) - [c3]Peilin Song, Franco Motika, Daniel R. Knebel, Rick Rizzolo, Mary P. Kusko, Julie Lee, Moyra K. McManus:
Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor. ITC 1999: 1073-1082 - 1998
- [j2]Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins:
Testing the 500-MHz IBM S/390 Microprocessor. IEEE Des. Test Comput. 15(3): 83-89 (1998) - [c2]Mary P. Kusko, Bryan J. Robbins, Thomas J. Snethen, Peilin Song, Thomas G. Foote, William V. Huott:
Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip. ITC 1998: 717-726 - 1997
- [j1]William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen:
Advanced microprocessor test strategy and methodology. IBM J. Res. Dev. 41(4&5): 611-628 (1997) - [c1]Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko:
Testing the 400-MHz IBM Generation-4 CMOS Chip. ITC 1997: 106-114
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