default search action

combined dblp search
author search
venue search
publication search

ask others

Paresh Gondalia

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

1990 – 1999

see FAQ

What is the meaning of the colors in the publication lists?

1995
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/tvlsi/JoneGG95
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/JoneGG95
Wen-Ben Jone, Paresh Gondalia, Allan Gutjahr:
Realizing a high measure of confidence for defect level analysis of random testing [VLSI]. IEEE Trans. Very Large Scale Integr. Syst. 3(3): 446-450 (1995)
1993
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/itc/GondaliaGJ93
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/GondaliaGJ93
Paresh Gondalia, Allan Gutjahr, Wen-Ben Jone:
Realizing a High Measure of Confidence for Defect Level Analysis of Random Testing. ITC 1993: 478-487

Coauthor Index

see FAQ

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.