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ORCIDKoen G. Verhaege
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Journal Articles
- 2006
[j6]Bart Keppens, Markus P. J. Mergens, Cong Son Trinh, Christian C. Russ, Benjamin Van Camp, Koen G. Verhaege:
ESD protection solutions for high voltage technologies. Microelectron. Reliab. 46(5-6): 677-688 (2006)- 2003
- [j5]Markus P. J. Mergens, Christian C. Russ, Koen G. Verhaege, John Armer, Phillip Jozwiak, Russ Mohn:
High holding current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation. Microelectron. Reliab. 43(7): 993-1000 (2003) - [j4]S. Trinh, Markus P. J. Mergens, Koen G. Verhaege, Christian C. Russ, John Armer, Phillip Jozwiak, Bart Keppens, Russ Mohn, G. Taylor, Frederic De Ranter:
Multi-finger turn-on circuits and design techniques for enhanced ESD performance and width scaling. Microelectron. Reliab. 43(9-11): 1537-1543 (2003) - 2002
- [j3]Koen G. Verhaege, Markus P. J. Mergens, Christian C. Russ, John Armer, Phillip Jozwiak:
Novel design of driver and ESD transistors with significantly reduced silicon area. Microelectron. Reliab. 42(1): 3-13 (2002) - 2001
- [j2]Koen G. Verhaege:
Editorial. Microelectron. Reliab. 41(3): 333 (2001) - [j1]Koen G. Verhaege, Christian C. Russ:
Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies. Microelectron. Reliab. 41(11): 1739-1749 (2001)
Conference and Workshop Papers
- 2005
- [c2]Markus P. J. Mergens, Geert Wybo, Bart Keppens, Benjamin Van Camp, Frederic De Ranter, Koen G. Verhaege, John Armer, Phillip Jozwiak, Christian C. Russ:
ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. ISCAS (2) 2005: 1194-1197 - 2004
- [c1]Markus P. J. Mergens, John Armer, Phillip Jozwiak, Bart Keppens, Frederic De Ranter, Koen G. Verhaege, R. Kumar:
Active-source-pump (ASP) technique for ESD design window expansion and ultra-thin gate oxide protection in sub-90nm technologies. CICC 2004: 251-254
Coauthor Index
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