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Geetani Edirisooriya
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1990 – 1999
- 1996
- [j5]Geetani Edirisooriya:
Closed Form Aliasing Probability For Q-ary Symmetric Errors. VLSI Design 4(3): 199-205 (1996) - 1995
- [j4]Geetani Edirisooriya, John P. Robinson:
Authors' reply to comments on "Aliasing Properties of Circular MISRs". J. Electron. Test. 6(1): 141-142 (1995) - [c9]Geetani Edirisooriya, Samantha Edirisooriya:
Scan Chain Fault Diagnosis with Fault Dictionaries. ISCAS 1995: 1912-1915 - [c8]Samantha Edirisooriya, Geetani Edirisooriya:
Diagnosis of scan path failures. VTS 1995: 250-255 - 1993
- [j3]Geetani Edirisooriya, John P. Robinson:
Aliasing properties of circular MISRs. J. Electron. Test. 4(2): 151-158 (1993) - [j2]Geetani Edirisooriya, John P. Robinson:
Test generation to minimize error masking. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(4): 540-549 (1993) - [c7]Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson:
On the Performance of Augmented Signature Testing. ISCAS 1993: 1607-1610 - [c6]Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson:
A new built-in self-test method based on prestored testing. VTS 1993: 10-16 - [c5]Geetani Edirisooriya, Samantha Edirisooriya, John P. Robinson:
Time and space correlated errors in signature analysis. VTS 1993: 275-281 - 1992
- [c4]Samantha Edirisooriya, Geetani Edirisooriya:
A signature efficient solution for remote file comparison. COMPSAC 1992: 149-154 - [c3]Geetani Edirisooriya, John P. Robinson:
Aliasing in Multiple-Valued Test Data Compaction. ISMVL 1992: 43-50 - [c2]Geetani Edirisooriya, John P. Robinson:
Design of low cost ROM based test generators. VTS 1992: 61-66 - 1991
- [j1]Geetani Edirisooriya, John P. Robinson:
Cyclic code weight spectra and BIST aliasing. J. Electron. Test. 2(2): 153-163 (1991) - [c1]Geetani Edirisooriya, John P. Robinson:
Aliasing Probability in Multiple Input Linear Signature Automata for Q-ary Symmetric Errors. ICCD 1991: 352-355
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