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Yasuo Nara

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2000 – 2009

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2007
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Yanli Pei, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki, Seiji Inumiya, Yasuo Nara:
Evaluation of Dielectric Reliability of Ultrathin HfSiO_xN_y in Metal-Gate Capacitors. IEICE Trans. Electron. 90-C(5): 962-967 (2007)

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