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ORCIDPia N. Sanda
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Journal Articles
- 2008
[j7]Pia N. Sanda, Jeffrey W. Kellington, Prabhakar Kudva, Ronald N. Kalla, Ryan B. McBeth, Jerry Ackaret, Ryan Lockwood, John Schumann, Christopher R. Jones:
Soft-error resilience of the IBM POWER6 processor. IBM J. Res. Dev. 52(3): 275-284 (2008)- [j6]Carl A. Bender, Pia N. Sanda, Prabhakar Kudva, Ricardo Mata, Vikas Pokala, Ryan Haraden, Matthew Schallhorn:
Soft-error resilience of the IBM POWER6 processor input/output subsystem. IBM J. Res. Dev. 52(3): 285-292 (2008) - [j5]Jude A. Rivers, Pradip Bose, Prabhakar Kudva, John-David Wellman, Pia N. Sanda, Ethan H. Cannon, Luiz C. Alves:
Phaser: Phased methodology for modeling the system-level effects of soft errors. IBM J. Res. Dev. 52(3): 293-306 (2008) - [j4]Kevin Reick, Pia N. Sanda, Scott B. Swaney, Jeffrey W. Kellington, Michael J. Mack, Michael S. Floyd, Daniel Henderson:
Fault-Tolerant Design of the IBM Power6 Microprocessor. IEEE Micro 28(2): 30-38 (2008) - 2005
- [j3]Sarita V. Adve, Pia N. Sanda:
Guest Editors' Introduction: Reliability-Aware Microarchitecture. IEEE Micro 25(6): 8-9 (2005) - 2003
- [j2]Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda, Philip Wu, Steven C. Wilson:
Latchup Analysis Using Emission Microscopy. Microelectron. Reliab. 43(9-11): 1603-1608 (2003) - 1999
- [j1]Wei Hwang, George Diedrich Gristede, Pia N. Sanda, Shao Y. Wang, David F. Heidel:
Implementation of a self-resetting CMOS 64-bit parallel adder with enhanced testability. IEEE J. Solid State Circuits 34(8): 1108-1117 (1999)
Conference and Workshop Papers
- 2010
- [c10]Subhasish Mitra, Kevin Brelsford, Pia N. Sanda:
Cross-layer resilience challenges: Metrics and optimization. DATE 2010: 1029-1034 - 2008
- [c9]Dimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia N. Sanda:
Soft Errors: System Effects, Protection Techniques and Case Studies. DATE 2008 - [c8]Pradeep Ramachandran, Prabhakar Kudva, Jeffrey W. Kellington, John Schumann, Pia N. Sanda:
Statistical Fault Injection. DSN 2008: 122-127 - 2007
- [c7]Subhasish Mitra, Pia N. Sanda, Norbert Seifert:
Soft Errors: Technology Trends, System Effects, and Protection Techniques. IOLTS 2007: 4 - 2005
- [c6]Pia N. Sanda:
The concern for soft errors is not overblown. ITC 2005: 2 - 2003
- [c5]Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia N. Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245 - 2000
- [c4]Stanislav Polonsky, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Pia N. Sanda:
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis. Asian Test Symposium 2000: 125- - 1999
- [c3]William V. Huott, Moyra K. McManus, Daniel R. Knebel, Steve Steen, Dennis Manzer, Pia N. Sanda, Steven C. Wilson, Yuen H. Chan, Antonio Pelella, Stanislav Polonsky:
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA). ITC 1999: 883-891 - 1998
- [c2]Wei Hwang, George Diedrich Gristede, Pia N. Sanda, Shao Y. Wang, David F. Heidel:
Design and implementation of high performance dynamic 64-bit parallel adder with enhanced testability. CICC 1998: 519-522 - [c1]Daniel R. Knebel, Pia N. Sanda, Moyra K. McManus, Jeffrey A. Kash, James C. Tsang, David P. Vallett, Leendert M. Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika:
Diagnosis and characterization of timing-related defects by time-dependent light emission. ITC 1998: 733-739
Coauthor Index
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