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Dirk Merlier

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2000 – 2009

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2001
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Anton Chichkov, Dirk Merlier, Peter Cox:
Current Testing Procedure for Deep Submicron Devices. J. Electron. Test. 17(3-4): 219-224 (2001)
2000
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Anton Chichkov, Dirk Merlier, Peter Cox:
Current testing procedure for deep submicron devices. ETW 2000: 91-96

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