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"Current testing procedure for deep submicron devices."

Anton Chichkov, Dirk Merlier, Peter Cox (2000)

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DOI: 10.1109/ETW.2000.873784

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

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Anton Chichkov, Dirk Merlier, Peter Cox:
Current testing procedure for deep submicron devices. ETW 2000: 91-96

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