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D. Sámal

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2008
[j2]
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Václav Papez, B. Kojecký, D. Sámal:
Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification. Microelectron. J. 39(6): 851-856 (2008)
2006
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B. Kojecký, Václav Papez, D. Sámal:
Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectron. J. 37(3): 269-274 (2006)

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