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C. N. Graham

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2000 – 2009

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2001
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B. K. Jones, C. N. Graham, A. Konczakowska, L. Hasse:
The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs PHEMTs. Microelectron. Reliab. 41(1): 87-97 (2001)

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