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E. Weis

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1990 – 1999

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1991
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E. Weis, E. Kinsbron, M. Snyder, B. Vogel, N. Croitoru:
Electromigration Effects in VLSI Due to Various Current Types. ITC 1991: 354-357
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E. Weis, E. Kinsbron, G. Chanoch, M. Snyder:
High accelerated lifetime test methods and procedures for VLSI microcircuit interconnection line certification. VTS 1991: 114-117

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