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T. Devoivre

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2000 – 2009

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2001
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M. Fadlallah, Arkadiusz Szewczyk, C. Giannakopoulos, B. Cretu, Frederic Monsieur, T. Devoivre, Jalal Jomaah, Gérard Ghibaudo:
Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta₂O₅ as gate dielectrics. Microelectron. Reliab. 41(9-10): 1361-1366 (2001)

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