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Michael J. Batek

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1990 – 1999

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1995
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Michael J. Batek:
Test-driven transformations in logic design. University of Michigan, USA, 1995
1994
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Michael J. Batek, John P. Hayes:
Optimal Testing and Design of Adders. VLSI Design 1(4): 285-298 (1994)
1992
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Michael J. Batek, John P. Hayes:
Test-Set Preserving Logic Transformations. DAC 1992: 454-458

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