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Tony Balistreri

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Journal Articles

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2009
[j2]
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  dblp key:
  - journals/jssc/CampbellLWKTSB09
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  persistent URL:
  - https://dblp.org/rec/journals/jssc/CampbellLWKTSB09
Charles Campbell, Cathy Lee, Victoria Williams, Ming-Yih Kao, Hua-Quen Tserng, Paul Saunier, Tony Balistreri:
A Wideband Power Amplifier MMIC Utilizing GaN on SiC HEMT Technology. IEEE J. Solid State Circuits 44(10): 2640-2647 (2009)
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S. Y. Park, Carlo Floresca, Uttiya Chowdhury, Jose L. Jimenez, Cathy Lee, Edward Beam, Paul Saunier, Tony Balistreri, Moon J. Kim:
Physical degradation of GaN HEMT devices under high drain bias reliability testing. Microelectron. Reliab. 49(5): 478-483 (2009)

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