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R. P. van Riessen

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1990 – 1999

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1991
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R. P. van Riessen, Hans G. Kerkhoff, J. M. J. Janssen:
A design-for-testability expert system for silicon compilers. VTS 1991: 10-15
1990
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R. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg:
Designing and Implementing an Architecture with Boundary Scan. IEEE Des. Test Comput. 7(1): 9-19 (1990)

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