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2020 – today
- 2021
[c113]Hassan Ebrahimi, Hans G. Kerkhoff:
Embedded Test Instrument for Intermittent Resistive Fault Detection at Chip Level and Its Reuse at Board Level. DDECS 2021: 75-80- 2020
- [c112]Ghazanfar Ali, Leila Bagheriye, Hans A. R. Manhaeve, Hans G. Kerkhoff:
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs. ATS 2020: 1-6 - [c111]Hassan Ebrahimi, Hans G. Kerkhoff:
A New Monitor Insertion Algorithm for Intermittent Fault Detection. ETS 2020: 1-6 - [c110]Leila Bagheriye, Ghazanfar Ali, Hans G. Kerkhoff:
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning. IOLTS 2020: 1-4 - [c109]Ghazanfar Ali, Leila Bagheriye, Hans G. Kerkhoff:
On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-Learning. ISCAS 2020: 1-5
2010 – 2019
- 2019
- [j27]Hassan Ebrahimi
, Hans G. Kerkhoff:
A Digital On-Line Monitor for Detecting Intermittent Resistance Faults at Board Level. J. Circuits Syst. Comput. 28(Supplement-1): 1940003:1-1940003:15 (2019) - [c108]Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff:
Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications. DFT 2019: 1-4 - [c107]Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff:
IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation. ETS 2019: 1-6 - [c106]Ahmed M. Y. Ibrahim, Hans G. Kerkhoff:
DARS: An EDA Framework for Reliability and Functional Safety Management of System-on-Chips. ITC 2019: 1-10 - [c105]Ahmed M. Y. Ibrahim, Hans G. Kerkhoff:
An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips. ITC-Asia 2019: 109-114 - [c104]Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff:
IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time. LATS 2019: 1-6 - [c103]Ahmed M. Y. Ibrahim, Hans G. Kerkhoff, Abrar Ibrahim, Mona Safar, M. Watheq El-Kharashi:
Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks. VTS 2019: 1-6 - 2018
- [c102]Jerrin Pathrose, Ghazanfar Ali, Hans G. Kerkhoff:
Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments. APCCAS 2018: 370-373 - [c101]Hassan Ebrahimi, Hans G. Kerkhoff:
Intermittent Resistance Fault Detection at Board Level. DDECS 2018: 135-140 - [c100]Ghazanfar Ali, Hassan Ebrahimi, Jerrin Pathrose, Hans G. Kerkhoff:
Design and implementation of a dependable CPSoC for automotive applications. ICPS 2018: 246-251 - [c99]Jerrin Pathrose, Ghazanfar Ali, Hans G. Kerkhoff:
IJTAG compatible analogue embedded instruments for MPSoC life-time prediction. LATS 2018: 1-4 - [c98]Ghazanfar Ali, Jerrin Pathrose, Hans G. Kerkhoff:
On-Chip Lifetime Prediction for Dependable Many-Processor SoCs Based on Data Fusion. MCSoC 2018: 44-51 - 2017
- [c97]Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke:
BASTION: Board and SoC test instrumentation for ageing and no failure found. DATE 2017: 115-120 - [c96]Andreina Zambrano, Hans G. Kerkhoff:
Improving the dependability of AMR sensors used in automotive applications. ETS 2017: 1-2 - [c95]Ahmed Ibrahim, Hans G. Kerkhoff:
A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. IOLTS 2017: 1-2 - [c94]Andreina Zambrano, Hans G. Kerkhoff:
A dependable AMR sensor system for automotive applications. ITC-Asia 2017: 59-64 - [c93]Hans G. Kerkhoff, Ghazanfar Ali, Hassan Ebrahimi, Ahmed Ibrahim:
An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability. ITC-Asia 2017: 65-70 - [c92]Hans G. Kerkhoff, Ghazanfar Ali, Jinbo Wan, Ahmed Ibrahim, Jerrin Pathrose:
Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems. VLSI-SoC 2017: 1-6 - [c91]Ahmed Ibrahim, Hans G. Kerkhoff:
Structured scan patterns retargeting for dynamic instruments access. VTS 2017: 1-6 - 2016
- [j26]Hans G. Kerkhoff, Hassan Ebrahimi:
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits. J. Circuits Syst. Comput. 25(3): 1640023:1-1640023:17 (2016) - [c90]Yong Zhao, Hans G. Kerkhoff:
Highly Dependable Multi-processor SoCs Employing Lifetime Prediction Based on Health Monitors. ATS 2016: 228-233 - [c89]Hassan Ebrahimi, Alireza Rohani, Hans G. Kerkhoff:
Detecting intermittent resistive faults in digital CMOS circuits. DFT 2016: 87-90 - [c88]Ahmed Ibrahim, Hans G. Kerkhoff:
Efficient utilization of hierarchical iJTAG networks for interrupts management. DFT 2016: 97-102 - [c87]Hassan Ebrahimi, Hans G. Kerkhoff:
Testing for Intermittent Resistive Faults in CMOS Integrated Systems. DSD 2016: 703-707 - [c86]Yong Zhao, Hans G. Kerkhoff:
A genetic algorithm based remaining lifetime prediction for a VLIW processor employing path delay and IDDX testing. DTIS 2016: 1-4 - [c85]Ahmed Ibrahim, Hans G. Kerkhoff:
Analysis and design of an on-chip retargeting engine for IEEE 1687 networks. ETS 2016: 1-6 - [c84]Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Görschwin Fey, Maksim Jenihhin, Artur Jutman, Hans G. Kerkhoff, Robert Könighofer, Jan Malburg, Shiri Moran, Jaan Raik, Gerard K. Rauwerda, Heinz Riener, Franz Röck, Konstantin Shibin, Kim Sunesen, Jinbo Wan, Yong Zhao:
Designing reliable cyber-physical systems overview associated to the special session at FDL'16. FDL 2016: 1-8 - [c83]Ghazanfar Ali, Ahmed Badawy, Hans G. Kerkhoff:
Accessing on-chip temperature health monitors using the IEEE 1687 standard. ICECS 2016: 776-779 - [c82]Ahmed Ibrahim, Hans G. Kerkhoff:
Towards an automated and reusable in-field self-test solution for MPSoCs. ICM 2016: 249-252 - [c81]Andreina Zambrano, Hans G. Kerkhoff:
Online monitoring of the maximum angle error in AMR sensors. IOLTS 2016: 211-212 - [c80]Alireza Rohani, Hassan Ebrahimi, Hans G. Kerkhoff:
A software framework to calculate local temperatures in CMOS processors. PATMOS 2016: 183-188 - [c79]Andreina Zambrano, Hans G. Kerkhoff:
Online digital compensation Method for AMR sensors. VLSI-SoC 2016: 1-6 - [c78]Juergen Alt, Paolo Bernardi, Alberto Bosio, Riccardo Cantoro, Hans G. Kerkhoff, Andreas Leininger, Wolfgang Molzer, Alessandro Motta, Christian Pacha, Alberto Pagani, Alireza Rohani, R. Strasser:
Thermal issues in test: An overview of the significant aspects and industrial practice. VTS 2016: 1-4 - 2015
- [c77]Hans G. Kerkhoff, Hassan Ebrahimi:
Intermittent Resistive Faults in Digital CMOS Circuits. DDECS 2015: 211-216 - [c76]Yong Zhao, Hans G. Kerkhoff:
Unit-Based Functional IDDT Testing for Aging Degradation Monitoring in a VLIW Processor. DSD 2015: 353-358 - [c75]Yong Zhao, Hans G. Kerkhoff:
Application of functional IDDQ testing in a VLIW processor towards detection of aging degradation. DTIS 2015: 1-5 - [c74]Jinbo Wan, Hans G. Kerkhoff:
New drain current model for nano-meter MOS transistors on-chip threshold voltage test. ETS 2015: 1-6 - [c73]Andreina Zambrano, Hans G. Kerkhoff:
Online digital offset voltage compensation method for AMR sensors. I2MTC 2015: 1512-1515 - [c72]Riccardo Cantoro, Matteo Sonza Reorda, Alireza Rohani, Hans G. Kerkhoff:
On the maximization of the sustained switching activity in a processor. IOLTS 2015: 34-35 - [c71]Andreina Zambrano, Hans G. Kerkhoff:
Fault-tolerant system for catastrophic faults in AMR sensors. IOLTS 2015: 65-70 - [c70]Jinbo Wan, Hans G. Kerkhoff:
Embedded instruments for enhancing dependability of analogue and mixed-signal IPs. NEWCAS 2015: 1-4 - 2014
- [c69]Jinbo Wan, Hans G. Kerkhoff:
An embedded offset and gain instrument for OpAmp IPs. DATE 2014: 1-4 - [c68]Muhammad Aamir Khan, Hans G. Kerkhoff:
Studying DAC capacitor-array degradation in charge-redistribution SAR ADCs. DDECS 2014: 15-20 - [c67]Yong Zhao, Hans G. Kerkhoff:
Design of an Embedded Health Monitoring Infrastructure for Accessing Multi-processor SoC Degradation. DSD 2014: 154-160 - [c66]Hans G. Kerkhoff, Jinbo Wan, Yong Zhao:
Linking aging measurements of health-monitors and specifications for multi-processor SoCs. DTIS 2014: 1-6 - [c65]Alireza Rohani, Hans G. Kerkhoff:
Two soft-error mitigation techniques for functional units of DSP processors. ETS 2014: 1-6 - [c64]Ahmed Ibrahim, Hans G. Kerkhoff:
iJTAG integration of complex digital embedded instruments. IDT 2014: 18-23 - [c63]Hans G. Kerkhoff:
Day 1: Invited talk 2: Dependable mixed-signal integrated systems under aging. IDT 2014: xiv - 2013
- [j25]Shaji Krishnan, Hans G. Kerkhoff:
Exploiting Multiple Mahalanobis Distance Metrics to Screen Outliers From Analog Product Manufacturing Test Responses. IEEE Des. Test 30(3): 18-24 (2013) - [j24]Alireza Rohani, Hans G. Kerkhoff:
Rapid transient fault insertion in large digital systems. Microprocess. Microsystems 37(2): 147-154 (2013) - [c62]Muhammad Aamir Khan, Hans G. Kerkhoff:
An indirect technique for estimating reliability of analog and mixed-signal systems during operational life. DDECS 2013: 159-164 - [c61]Muhammad Aamir Khan, Hans G. Kerkhoff:
Analysing degradation effects in charge-redistribution SAR ADCs. DFTS 2013: 65-70 - [c60]Muhammad Aamir Khan, Hans G. Kerkhoff:
The Essence of Reliability Estimation during Operational Life for Achieving High System Dependability. DSD 2013: 575-581 - [c59]Yong Zhao, Xiao Zhang, Hans G. Kerkhoff:
Power-dissipation comparison of two dependability approaches for multi-processor systems. DTIS 2013: 56-61 - [c58]Muhammad Aamir Khan, Hans G. Kerkhoff:
Monitoring operating temperature and supply voltage in achieving high system dependability. DTIS 2013: 108-112 - [c57]Jinbo Wan, Hans G. Kerkhoff:
An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. ISQED 2013: 31-37 - [c56]Alireza Rohani, Hans G. Kerkhoff, Enrico Costenaro, Dan Alexandrescu:
Pulse-length determination techniques in the rectangular single event transient fault model. ICSAMOS 2013: 213-218 - 2012
- [j23]Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud:
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus. J. Electron. Test. 28(4): 393-404 (2012) - [c55]Jinbo Wan, Hans G. Kerkhoff:
Monitoring active filters under automotive aging scenarios with embedded instrument. DATE 2012: 1096-1101 - [c54]Hans G. Kerkhoff, Yong Zhao:
The design of dependable flexible multi-sensory System-on-Chips for security applications. DDECS 2012: 133-138 - [c53]Alireza Rohani, Hans G. Kerkhoff:
An on-line soft error mitigation technique for control logic of VLIW processors. DFT 2012: 85-91 - [c52]Benaoumeur Senouci, Anne-Johan Annema, Mark J. Bentum, Hans G. Kerkhoff:
Investigating Dependability of Short-Range Wireless Embedded Systems through Hardware Platform Based Design. DSD 2012: 837-843 - [c51]Shaji Krishnan, Hans G. Kerkhoff:
A robust metric for screening outliers from analogue product manufacturing tests responses. ETS 2012: 1-6 - 2011
- [c50]Muhammad Aamir Khan, Hans G. Kerkhoff:
A system-level platform for dependability enhancement and its analysis for mixed-signal SoCs. DDECS 2011: 17-22 - [c49]Muhammad Aamir Khan, Hans G. Kerkhoff:
SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life. DFT 2011: 374-381 - [c48]Alireza Rohani, Hans G. Kerkhoff:
A Technique for Accelerating Injection of Transient Faults in Complex SoCs. DSD 2011: 213-220 - [c47]Alireza Rohani, Hans G. Kerkhoff:
Study of the effects of SET induced faults on submicron technologies. DSN Workshops 2011: 41-46 - [c46]Shaji Krishnan, Hans G. Kerkhoff:
A Robust Metric for Screening Outliers from Analogue Product Manufacturing Tests Responses. ETS 2011: 159-164 - [c45]Jinbo Wan, Hans G. Kerkhoff:
Boosted gain programmable Opamp with embedded gain monitor for dependable SoCs. ISOCC 2011: 294-297 - [c44]Xiao Zhang, Hans G. Kerkhoff:
A Dependability Solution for Homogeneous MPSoCs. PRDC 2011: 53-62 - 2010
- [c43]Xiaoqin Sheng, Hans G. Kerkhoff:
The Test Ability of an Adaptive Pulse Wave for ADC Testing. Asian Test Symposium 2010: 289-294 - [c42]Shaji Krishnan, Klaas D. Doornbos, Rudi Brand, Hans G. Kerkhoff:
Block-level bayesian diagnosis of analogue electronic circuits. DATE 2010: 1767-1772 - [c41]Hans G. Kerkhoff, Xiao Zhang:
Design of an Infrastructural IP Dependability Manager for a Dependable Reconfigurable Many-Core Processor. DELTA 2010: 270-275 - [c40]Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen:
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism. DSD 2010: 531-537 - [c39]Xiaoqin Sheng, Vincent Kerzerho, Hans G. Kerkhoff:
Predicting dynamic specifications of ADCs with a low-quality digital input signal. ETS 2010: 158-163 - [c38]Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen:
New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. ETS 2010: 243 - [c37]Shaji Krishnan, Hans G. Kerkhoff:
Multivariate model for test response analysis. ETS 2010: 250 - [c36]Timon D. ter Braak, S. T. Burgess, H. Hurskainen, Hans G. Kerkhoff, Bart Vermeulen, Xiao Zhang:
On-line dependability enhancement of multiprocessor SoCs by resource management. SoC 2010: 103-110
2000 – 2009
- 2009
- [j22]Hans G. Kerkhoff, Xiao Zhang:
Fault co-simulation for test evaluation of heterogeneous integrated biological systems. Microelectron. J. 40(7): 1048-1053 (2009) - [c35]Xiao Zhang, Hans G. Kerkhoff:
Design of a Highly Dependable Beamforming Chip. DSD 2009: 729-735 - [c34]Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud:
Algorithms for ADC Multi-site Test with Digital Input Stimulus. ETS 2009: 45-50 - 2008
- [j21]Hans G. Kerkhoff, Xiao Zhang, Frédérick Mailly, Pascal Nouet, Hongyuan Liu, Andrew Richardson:
A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data. VLSI Design 2008: 437879:1-437879:9 (2008) - [c33]Hans G. Kerkhoff, Jarkko J. M. Huijts:
Testing of a Highly Reconfigurable Processor Core for Dependable Data Streaming Applications. DELTA 2008: 38-44 - [c32]Oscar Kuiken, Xiao Zhang, Hans G. Kerkhoff:
Built-in-Self-Diagnostics for a NoC-Based Reconfigurable IC for Dependable Beamforming Applications. DFT 2008: 45-53 - 2007
- [j20]Hans G. Kerkhoff:
Testing Microelectronic Biofluidic Systems. IEEE Des. Test Comput. 24(1): 72-82 (2007) - 2006
- [c31]Hans G. Kerkhoff, Xiao Zhang, R. W. Barber, D. R. Emerson:
Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems. DELTA 2006: 177-182 - 2005
- [j19]Hans G. Kerkhoff:
The test search for true mixed-signal cores. Microelectron. J. 36(12): 1103-1111 (2005) - [c30]Hans G. Kerkhoff:
Testing of MEMS-based microsystems. ETS 2005: 223-228 - 2004
- [j18]Octavian Petre, Hans G. Kerkhoff:
Scan Test Strategy for Asynchronous-Synchronous Interfaces. J. Electron. Test. 20(6): 639-645 (2004) - [c29]Hans G. Kerkhoff, Arun A. Joseph:
Testability Issues in Superconductor Electronic. DELTA 2004: 9-14 - 2003
- [j17]Nur Engin, Hans G. Kerkhoff:
Fast Fault Simulation for Nonlinear Analog Circuits. IEEE Des. Test Comput. 20(2): 40-47 (2003) - [j16]Frank te Beest, Ad M. G. Peeters, Kees van Berkel, Hans G. Kerkhoff:
Synchronous Full-Scan for Asynchronous Handshake Circuits. J. Electron. Test. 19(4): 397-406 (2003) - [j15]Hans G. Kerkhoff, Bozena Kaminska:
Analog and mixed signal test techniques for SoCs. Microelectron. J. 34(10): 887-888 (2003) - [j14]M. Stancic, Hans G. Kerkhoff:
Testability-analysis driven test-generation of analogue cores. Microelectron. J. 34(10): 913-917 (2003) - [c28]Octavian Petre, Hans G. Kerkhoff:
Scan test strategy for asynchronous-synchronous interfaces [SoC testing]. ETW 2003: 43-48 - [c27]H. J. Vermaak, Hans G. Kerkhoff:
Enhanced P1500 compliant wrapper suitable for delay fault testing of embedded cores. ETW 2003: 121-126 - [c26]Arun A. Joseph, Hans G. Kerkhoff:
Towards Structural Testing of Superconductor Electronics. ITC 2003: 1182-1191 - [c25]Hans G. Kerkhoff, Mustafa Acar:
Testable Design and Testing of Micro-Electro-Fluidic Arrays. VTS 2003: 403-409 - 2002
- [j13]V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
An Implementation for Test-Time Reduction in VLIW Transport-Triggered Architectures. J. Electron. Test. 18(2): 203-212 (2002) - [c24]Octavian Petre, Hans G. Kerkhoff:
On-Chip Tap-Delay Measurements for a Digital Delay-Line Used in High-Speed Inter-Chip Data Communications. Asian Test Symposium 2002: 122- - [c23]Hans G. Kerkhoff, Arun A. Joseph, Sander Heuvelmans:
Testable Design and Testing of High-Speed Superconductor Microelectronics. DELTA 2002: 8-12 - [c22]Frank te Beest, Ad M. G. Peeters, Marc Verra, Kees van Berkel, Hans G. Kerkhoff:
Automatic Scan Insertion and Test Generation for Asynchronous Circuits. ITC 2002: 804-813 - [c21]M. Stancic, Liquan Fang, M. H. H. Weusthof, R. M. W. Tijink, Hans G. Kerkhoff:
A New Test Generation Approach for Embedded Analogue Cores in SoC. ITC 2002: 861-869 - [c20]Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim:
SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450 - 2001
- [j12]David San Segundo Bello, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
Modeling a Verification Test System for Mixed-Signal Circuits. IEEE Des. Test Comput. 18(1): 63-71 (2001) - [j11]Hans G. Kerkhoff, Han Speek, M. Shashani, Manoj Sachdev:
Design for Delay Testability in High-Speed Digital ICs. J. Electron. Test. 17(3-4): 225-231 (2001) - [j10]Hans G. Kerkhoff, Hans P. A. Hendriks:
Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems. J. Electron. Test. 17(5): 427-437 (2001) - [j9]Hans G. Kerkhoff:
Testing of a microanalysis system. IEEE Trans. Instrum. Meas. 50(6): 1485-1489 (2001) - [c19]Herman J. Vermaak, Hans G. Kerkhoff:
Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations. ETW 2001: 35-41 - [c18]Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff:
Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design. ETW 2001: 61-67 - [c17]V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
An implementation for test-time reduction in VLIW transport-triggered architectures. ETW 2001: 106-113 - [c16]Octavian Petre, Hans G. Kerkhoff:
Increasing the Fault Coverage in Multiple Clock Domain Systems by Using On-Line Testing of Synchronizers. IOLTW 2001: 95-99 - [c15]Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff:
Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC 2001: 1098-1107 - 2000
- [c14]V. A. Zivkovic, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
Design and Test Space Exploration of Transport-Triggered Architectures. DATE 2000: 146-151 - [c13]Han Speek, Hans G. Kerkhoff, Manoj Sachdev, Mansour Shashaani:
Bridging the testing speed gap: design for delay testability. ETW 2000: 3-8 - [c12]Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev:
A Low-Speed BIST Framework for High-Performance Circuit Testing. VTS 2000: 349-358
1990 – 1999
- 1999
- [j8]Manoj Sachdev, Hans G. Kerkhoff:
Configurations for IDDQ-Testable PLAs. IEEE Des. Test Comput. 16(2): 58-65 (1999) - [j7]Richard Rosing, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Manoj Sachdev:
Off-Chip Diagnosis of Aperture Jitter in Full-Flash Analog-to-Digital Converters. J. Electron. Test. 14(1-2): 67-74 (1999) - [j6]Nur Engin, Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek:
Integrated Design and Test of Mixed-Signal Circuits. J. Electron. Test. 14(1-2): 75-83 (1999) - [j5]Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electron. Test. 14(1-2): 125-131 (1999) - 1998
- [c11]Hans G. Kerkhoff:
Microsystem Testing: Challenge or Common Knowledge? Asian Test Symposium 1998: 510-511 - 1997
- [c10]Ronald J. W. T. Tangelder, G. Diemel, Hans G. Kerkhoff:
Smart sensor system application: an integrated compass. ED&TC 1997: 195-199 - [c9]V. Kaal, Hans G. Kerkhoff:
Compact structural test generation for analog macros. ED&TC 1997: 581-587 - 1996
- [c8]Joan Oliver, Hans G. Kerkhoff:
Test Structures on MCM Active Substrate: Is it worthwhile? ED&TC 1996: 126-130 - [c7]Hans G. Kerkhoff, Ronald J. W. T. Tangelder, Han Speek, Nur Engin:
MISMATCH: a basis for semi-automatic functional mixed-signal test-pattern generation. ICECS 1996: 1072-1075 - 1995
- [c6]G. Van Brakel, Uwe Gläser, Hans G. Kerkhoff, Heinrich Theodor Vierhaus:
Gate delay fault test generation for non-scan circuits. ED&TC 1995: 308-313 - 1992
- [c5]Rafael Peset Llopis, Hans G. Kerkhoff:
A fast and accurate characterization method for full-CMOS circuits. EURO-DAC 1992: 410-415 - 1991
- [c4]Rafael Peset Llopis, R. J. H. Koopman, Hans G. Kerkhoff, J. A. Braat:
A performance analysis tool for performance-driven micro-cell generation. EURO-DAC 1991: 576-580 - [c3]R. P. van Riessen, Hans G. Kerkhoff, J. M. J. Janssen:
A design-for-testability expert system for silicon compilers. VTS 1991: 10-15 - 1990
- [j4]R. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg:
Designing and Implementing an Architecture with Boundary Scan. IEEE Des. Test Comput. 7(1): 9-19 (1990) - [j3]Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff:
Testability analysis of analog systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(6): 573-583 (1990) - [c2]Jon T. Butler, Hans G. Kerkhoff, Siep Onneweer:
A Comparative Analysis of Multiplexer Techniques for the Minimization of Function Cost Using the Costtable Approach. ISMVL 1990: 286-291
1980 – 1989
- 1988
- [j2]Jon T. Butler, Hans G. Kerkhoff:
Multiple-Valued CCD Circuits. Computer 21(4): 58-69 (1988) - [c1]Gertjan J. Hemink, Berend W. Meijer, Hans G. Kerkhoff:
TASTE: A Tool for Analog System Testability Evaluation. ITC 1988: 829-838 - 1981
- [j1]Hans G. Kerkhoff, Marius L. Tervoert:
Multiple-Valued Logic Charge-Coupled Devices. IEEE Trans. Computers 30(9): 644-652 (1981)
Coauthor Index
Ahmed Ibrahim 0001
aka: Ahmed M. Y. Ibrahim
aka: Ahmed M. Y. Ibrahim
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last updated on 2024-04-25 05:44 CEST by the dblp team
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