"Detectability of Resistive Open Defects with Analog Relaxation Oscillators ..."

Yuya Yamahashi et al. (2024)

> Home

Details and statistics

DOI: 10.1109/3DIC63395.2024.10830070

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/3dic/YamahashiOYLH24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/3dic/YamahashiOYLH24
Yuya Yamahashi, Yuto Ohtera, Hiroyuki Yotsuyanagi, Shyue-Kung Lu, Masaki Hashizume:
Detectability of Resistive Open Defects with Analog Relaxation Oscillators Under Unit-to-Unit Variations of Dies. 3DIC 2024: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.