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"Laplacian eigenmaps and bayesian clustering based layout pattern sampling ..."

Tetsuaki Matsunawa, Bei Yu, David Z. Pan (2016)

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DOI: 10.1109/ASPDAC.2016.7428090

access: closed

type: Conference or Workshop Paper

metadata version: 2018-01-30

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  - conf/aspdac/MatsunawaYP16
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Tetsuaki Matsunawa, Bei Yu, David Z. Pan:
Laplacian eigenmaps and bayesian clustering based layout pattern sampling and its applications to hotspot detection and OPC. ASP-DAC 2016: 679-684

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