default search action
"Test Margin and Yield in Bundled Data and Ring-Oscillator Based Designs."
Yang Zhang et al. (2017)
- Yang Zhang, Haipeng Zha, Vaishnavi Sahir, Huimei Cheng, Peter A. Beerel:
Test Margin and Yield in Bundled Data and Ring-Oscillator Based Designs. ASYNC 2017: 85-93
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.