"Test Margin and Yield in Bundled Data and Ring-Oscillator Based Designs."

Yang Zhang et al. (2017)

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DOI: 10.1109/ASYNC.2017.13

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-07

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  dblp key:
  - conf/async/0014ZSCB17
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  persistent URL:
  - https://dblp.org/rec/conf/async/0014ZSCB17
Yang Zhang, Haipeng Zha, Vaishnavi Sahir, Huimei Cheng, Peter A. Beerel:
Test Margin and Yield in Bundled Data and Ring-Oscillator Based Designs. ASYNC 2017: 85-93

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