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"Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential ..."
Toshinori Hosokawa et al. (1999)
- Toshinori Hosokawa, Toshihiro Hiraoka, Tomoo Inoue, Hideo Fujiwara:
Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. Asian Test Symposium 1999: 192-
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