Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay ..."

Shao-Chun Hung et al. (2020)

> Home

Details and statistics

DOI: 10.1109/ATS49688.2020.9301568

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ats/HungLLC20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/HungLLC20
Shao-Chun Hung, Yi-Chen Lu, Sung Kyu Lim, Krishnendu Chakrabarty:
Power Supply Noise-Aware Scan Test Pattern Reshaping for At-Speed Delay Fault Testing of Monolithic 3D ICs ^*. ATS 2020: 1-6

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.