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"Sequential Test Generation Based on Circuit Pseudo-Transformation."

Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara (1997)

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DOI: 10.1109/ATS.1997.643919

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ats/OhtakeIF97
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  persistent URL:
  - https://dblp.org/rec/conf/ats/OhtakeIF97
Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara:
Sequential Test Generation Based on Circuit Pseudo-Transformation. Asian Test Symposium 1997: 62-67

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