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"A STAFAN-like functional testability measure for register-level circuits."

C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal (1995)

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DOI: 10.1109/ATS.1995.485336

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ats/RavikumarSA95
C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal:
A STAFAN-like functional testability measure for register-level circuits. Asian Test Symposium 1995: 192-198

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