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"Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft ..."
Aibin Yan et al. (2018)
- Aibin Yan, Yafei Ling, Kang Yang, Zhili Chen, Maoxiang Yi:
Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS. ATS 2018: 86-91
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