"Capture in Turn Scan for Reduction of Test Data Volume, Test Application ..."

Zhiqiang You et al. (2010)

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DOI: 10.1109/ATS.2010.70

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Zhiqiang You, Jiedi Huang, Michiko Inoue, Jishun Kuang, Hideo Fujiwara:
Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power. Asian Test Symposium 2010: 371-374

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