"An observer based sample detection scheme for atomic force microscopy."

Abu Sebastian, Deepak R. Sahoo, Murti V. Salapaka (2003)

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DOI: 10.1109/CDC.2003.1272933

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-07

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Abu Sebastian, Deepak R. Sahoo, Murti V. Salapaka:
An observer based sample detection scheme for atomic force microscopy. CDC 2003: 2132-2137

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