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"Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS ..."

Peter Hazucha et al. (2003)

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DOI: 10.1109/CICC.2003.1249472

access: closed

type: Conference or Workshop Paper

metadata version: 2022-02-28

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  - https://dblp.org/rec/conf/cicc/HazuchaKWBTMSDN03
Peter Hazucha, Tanay Kamik, Steven Walstra, Bradley A. Bloechel, James W. Tschanz, Jose Maiz, Krishnamurthy Soumyanath, Greg Dermer, Siva G. Narendra, Vivek De, Shekhar Borkar:
Measurements and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process. CICC 2003: 617-620

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