Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Invited - Optimizing device reliability effects at the intersection of ..."

Deepashree Sengupta, Vivek Mishra, Sachin S. Sapatnekar (2016)

> Home

Details and statistics

DOI: 10.1145/2897937.2905016

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dac/SenguptaMS16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/SenguptaMS16
Deepashree Sengupta, Vivek Mishra, Sachin S. Sapatnekar:
Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture. DAC 2016: 31:1-31:6

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.