"Invited - Optimizing device reliability effects at the intersection of ..."

Deepashree Sengupta, Vivek Mishra, Sachin S. Sapatnekar (2016)

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DOI: 10.1145/2897937.2905016

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Deepashree Sengupta, Vivek Mishra, Sachin S. Sapatnekar:
Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture. DAC 2016: 31:1-31:6

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