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"Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed ..."
Xiaoqing Wen et al. (2007)
- Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Seiji Kajihara, Yuji Ohsumi, Kewal K. Saluja:
Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. DAC 2007: 527-532
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