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"Automatic success tree-based reliability analysis for the consideration of ..."

Hananeh Aliee et al. (2013)

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DOI: 10.7873/DATE.2013.329

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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  dblp key:
  - conf/date/AlieeGRT13
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  persistent URL:
  - https://dblp.org/rec/conf/date/AlieeGRT13
Hananeh Aliee, Michael Glaß, Felix Reimann, Jürgen Teich:
Automatic success tree-based reliability analysis for the consideration of transient and permanent faults. DATE 2013: 1621-1626

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