"BISD: Scan-based Built-In self-diagnosis."

Melanie Elm, Hans-Joachim Wunderlich (2010)

Details and statistics

DOI: 10.1109/DATE.2010.5456997

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics