"Switch level hot-carrier reliability enhancement of VLSI circuits."

Aurobindo Dasgupta, Ramesh Karri (1995)

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DOI: 10.1109/DFTVS.1995.476938

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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Aurobindo Dasgupta, Ramesh Karri:
Switch level hot-carrier reliability enhancement of VLSI circuits. DFT 1995: 63-71

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