"A Probabilistic Method to Detect Anomalies in Embedded Systems."

Mahroo Zandrahimi, Alireza Zarei, Hamid R. Zarandi (2010)

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DOI: 10.1109/DFT.2010.25

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Mahroo Zandrahimi, Alireza Zarei, Hamid R. Zarandi:
A Probabilistic Method to Detect Anomalies in Embedded Systems. DFT 2010: 152-159

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