"Material and device innovation impact on reliability for scaled CMOS ..."

Tanya Nigam et al. (2017)

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DOI: 10.1109/ESSDERC.2017.8066610

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-12

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Tanya Nigam, Andreas Kerber, Tian Shen, Rakesh Ranjan, Linjun Cao:
Material and device innovation impact on reliability for scaled CMOS technologies. ESSDERC 2017: 134-139

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