"On the understanding of cathode related trapping effects in GaN-on-Si ..."

William Vandendaele et al. (2017)

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DOI: 10.1109/ESSDERC.2017.8066608

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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William Vandendaele, Thomas Lorin, Romain Gwoziecki, Yannick Baines, Jérome Biscarrat, Marie-Anne Jaud, Charlotte Gillot, Matthew Charles, Marc Plissonnier, Gilles Reimbold:
On the understanding of cathode related trapping effects in GaN-on-Si Schottky diodes. ESSDERC 2017: 126-129

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