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"Statistical variability in 14-nm node SOI FinFETs and its impact on ..."

Xingsheng Wang et al. (2012)

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DOI: 10.1109/ESSDERC.2012.6343346

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-23

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Xingsheng Wang, Binjie Cheng, Andrew R. Brown, Campbell Millar, Asen Asenov:
Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design. ESSDERC 2012: 113-116

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