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"New drain current model for nano-meter MOS transistors on-chip threshold ..."

Jinbo Wan, Hans G. Kerkhoff (2015)

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DOI: 10.1109/ETS.2015.7138751

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Jinbo Wan, Hans G. Kerkhoff:
New drain current model for nano-meter MOS transistors on-chip threshold voltage test. ETS 2015: 1-6

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