"Efficient Delay Test Generation for Modular Circuits."

Nidhi Agrawal, Parul Agarwal, C. P. Ravikumar (1996)

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DOI: 10.1109/GLSV.1996.497623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Nidhi Agrawal, Parul Agarwal, C. P. Ravikumar:
Efficient Delay Test Generation for Modular Circuits. Great Lakes Symposium on VLSI 1996: 220-

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