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"Layout Characterization and Power Density Analysis for Shorted-Gate and ..."
Tiansong Cui et al. (2015)
- Tiansong Cui, Bowen Chen, Yanzhi Wang, Shahin Nazarian, Massoud Pedram:
Layout Characterization and Power Density Analysis for Shorted-Gate and Independent-Gate 7nm FinFET Standard Cells. ACM Great Lakes Symposium on VLSI 2015: 33-38
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