"Improving multi-level NAND flash memory storage reliability using ..."

Shu Li, Tong Zhang (2009)

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DOI: 10.1145/1531542.1531655

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Shu Li, Tong Zhang:
Improving multi-level NAND flash memory storage reliability using concatenated TCM-BCH coding. ACM Great Lakes Symposium on VLSI 2009: 499-504

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