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"HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting ..."
Yixin Luo et al. (2018)
- Yixin Luo, Saugata Ghose, Yu Cai, Erich F. Haratsch, Onur Mutlu:
HeatWatch: Improving 3D NAND Flash Memory Device Reliability by Exploiting Self-Recovery and Temperature Awareness. HPCA 2018: 504-517
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