"Built-in test methodology for a full custom processor chip."

Ravinder S. Shergill, Pak-Ho Yeung, Patrick A. Tucci (1989)

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DOI: 10.1109/ICCD.1989.63430

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-28

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Ravinder S. Shergill, Pak-Ho Yeung, Patrick A. Tucci:
Built-in test methodology for a full custom processor chip. ICCD 1989: 571-575

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