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"Offset measurement method for accurate characterization of BTI-induced ..."
Swaraj Mahato et al. (2012)
- Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen:

Offset measurement method for accurate characterization of BTI-induced degradation in opamps. ICECS 2012: 661-664

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