"Off-state stress degradation mechanism on advanced p-MOSFETs."

Moonju Cho et al. (2015)

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DOI: 10.1109/ICICDT.2015.7165893

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Moonju Cho, Alessio Spessot, Ben Kaczer, Marc Aoulaiche, Romain Ritzenthaler, Tom Schram, Pierre Fazan, Naoto Horiguchi, Dimitri Linten:
Off-state stress degradation mechanism on advanced p-MOSFETs. ICICDT 2015: 1-4

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